AIP ADVANCES, vol. 5, no. 12, page. 127221, 2015-12
MICRON, vol. 79, page. 101 - 109, 2015-12
IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62, no. 11, page. 3498 - 3507, 2015-11
MICROELECTRONIC ENGINEERING, vol. 147, page. 321 - 324, 2015-11-01
MICROELECTRONIC ENGINEERING, vol. 147, page. 318 - 320, 2015-11-01
APPLIED PHYSICS LETTERS, vol. 107, no. 11, 2015-09-14
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 7, page. 681 - 683, 2015-07
APPLIED PHYSICS LETTERS, vol. 106, no. 23, 2015-06
SCIENTIFIC REPORTS, vol. 5, 2015-05-05
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 5, page. 457 - 459, 2015-05
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, vol. 62, no. 4, page. 2410 - 2419, 2015-04
JAPANESE JOURNAL OF APPLIED PHYSICS, vol. 54, no. 4, page. 04DD09, 2015-04
APPLIED PHYSICS LETTERS, vol. 106, no. 11, 2015-03-16
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 3, page. 238 - 240, 2015-03
SOLID-STATE ELECTRONICS, vol. 104, page. 70 - 74, 2015-02
RSC ADVANCES, vol. 5, no. 124, page. 102772 - 102779, 2015-01
ADVANCED MATERIALS, vol. 27, no. 1, page. 59 - 64, 2015-01
IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 1, page. 32 - 34, 2015-01
ECS SOLID STATE LETTERS, vol. 4, no. 7, page. Q25 - Q28, 2015-01
ECS Solid State Letters, vol. 4, no. 3, page. 25 - 28, 2015-01