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LEE, JEONG SOO(이정수)
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Dept of Electrical Engineering(전자전기공학과)
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Publication & Time Cited Count (For the Last 5 years)
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Date issued
2018
1
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Article
1
Subject
Analog Figure-of-Merit
1
Junctionless
1
Nanowire
1
Random Discrete Dopant (RDD)
1
TRANSISTORS
1
Workfunction Variability (WFV)
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SCIE
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: TRANSISTORS
Date Issued
: 2018
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Article
Analog Figure-of-Merits Comparison of Gate Workfunction Variability and Random Discrete Dopant Between Inversion-Mode and Junctionless Nanowire FETs
SCIE
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, vol. 18, no. 9, page. 6598 - 6601, 2018-09
Kim, Jiwon
;
Oh, Hyeongwan
;
Jin, Bo
;
Baek, Rock-Hyun
;
Lee, Jeong-Soo
1
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