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BAEK, ROCK HYUN(백록현) scopus

Department: Dept of Electrical Engineering(전자전기공학과)

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Publication & Time Cited Count (For the Last 5 years)

Results 1-6 of 6 (Search time: 0.001 seconds).

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Subject : FinFET

Article

Reduction of Process Variations for Sub-5-nm Node Fin and Nanosheet FETs Using Novel Process SchemeSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 67, no. 7, page. 2732 - 2737, 2020-07

Article

Systematic DC/AC Performance Benchmarking of Sub-7-nm Node FinFETs and Nanosheet FETsSCIESCOPUS

IEEE Journal of the Electron Devices Society, vol. 6, no. 1, page. 942 - 947, 2018-08

Article

Process-Induced Variations of 10-nm Node Bulk nFinFETs Considering Middle-of-Line ParasiticsSCIESCOPUS

IEEE Transactions on Electron Devices, vol. 63, no. 9, page. 3399 - 3405, 2016-09

Article

Investigation of RC Parasitics Considering Middle-of-the-Line in Si-Bulk FinFETs for Sub-14-nm Node Logic ApplicationsSCIESCOPUS

IEEE TRANSACTIONS ON ELECTRON DEVICES, vol. 62, no. 10, page. 3441 - 3444, 2015-10

Article

Junction Design Strategy for Si Bulk FinFETs for System-on-Chip Applications Down to the 7-nm NodeSCIESCOPUS

IEEE ELECTRON DEVICE LETTERS, vol. 36, no. 10, page. 994 - 996, 2015-10

Article

Investigation of Process-Induced Performance Variability and Optimization of the 10 nm Technology Node Si Bulk FinFETsSCIESCOPUS

SOLID-STATE ELECTRONICS, vol. 96, page. 27 - 33, 2014-06

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