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Evaluation of Two Process Yields in Acceptance Sampling Plans SCIE SCOPUS

Title
Evaluation of Two Process Yields in Acceptance Sampling Plans
Authors
Butt, K. A.Aslam, M.Wang, F. -K.Lee, H.Jun, C. -H.
Date Issued
2018-03
Publisher
AMER SOC TESTING MATERIALS
Abstract
Competitive activities always support improvement in quality. In this study, a repetitive group sampling plan is designed to compare the two process yield indices of respective suppliers. A ratio statistic of two yield indices is proposed for estimated linear profiles under normal assumptions. The operating characteristic function is derived by using the distribution of the ratio statistic. Designed parameters are optimized to minimize the sample size required.
URI
https://oasis.postech.ac.kr/handle/2014.oak/99310
DOI
10.1520/JTE20160447
ISSN
0090-3973
Article Type
Article
Citation
JOURNAL OF TESTING AND EVALUATION, vol. 46, no. 2, page. 756 - 763, 2018-03
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전치혁JUN, CHI HYUCK
Dept of Industrial & Management Enginrg
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