Evaluation of Two Process Yields in Acceptance Sampling Plans
SCIE
SCOPUS
- Title
- Evaluation of Two Process Yields in Acceptance Sampling Plans
- Authors
- Butt, K. A.; Aslam, M.; Wang, F. -K.; Lee, H.; Jun, C. -H.
- Date Issued
- 2018-03
- Publisher
- AMER SOC TESTING MATERIALS
- Abstract
- Competitive activities always support improvement in quality. In this study, a repetitive group sampling plan is designed to compare the two process yield indices of respective suppliers. A ratio statistic of two yield indices is proposed for estimated linear profiles under normal assumptions. The operating characteristic function is derived by using the distribution of the ratio statistic. Designed parameters are optimized to minimize the sample size required.
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/99310
- DOI
- 10.1520/JTE20160447
- ISSN
- 0090-3973
- Article Type
- Article
- Citation
- JOURNAL OF TESTING AND EVALUATION, vol. 46, no. 2, page. 756 - 763, 2018-03
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- There are no files associated with this item.
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