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Cited 152 time in webofscience Cited 175 time in scopus
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Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods

Title
Junction and carrier temperature measurements in deep-ultraviolet light-emitting diodes using three different methods
Authors
Xi, YXi, JQGessmann, TShah, JMKim, JKSchubert, EFFischer, AJCrawford, MHBogart, KHAAllerman, AA
POSTECH Authors
Kim, JK
Date Issued
2005-01
Publisher
AMER INST PHYSICS
URI
https://oasis.postech.ac.kr/handle/2014.oak/9485
DOI
10.1063/1.1849838
ISSN
0003-6951
Article Type
Article
Citation
APPLIED PHYSICS LETTERS, vol. 86, no. 3, 2005-01
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김종규KIM, JONG KYU
Dept of Materials Science & Enginrg
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