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Cited 69 time in webofscience Cited 69 time in scopus
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dc.contributor.authorYang, June-Mo-
dc.contributor.authorKim, Seul-Gi-
dc.contributor.authorSeo, Ja-Young-
dc.contributor.authorCuhadar, Can-
dc.contributor.authorSon, Dae-Yong-
dc.contributor.authorLEE, DONGHWA-
dc.contributor.authorPark, Nam-Gyu-
dc.date.accessioned2018-10-04T05:48:33Z-
dc.date.available2018-10-04T05:48:33Z-
dc.date.created2018-07-28-
dc.date.issued2018-07-
dc.identifier.issn2199-160X-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/92302-
dc.description.abstractOrganic-inorganic halide perovskite is regarded as one of the potential candidates for next generation resistive switching memory (memristor) material because of fast, millivolt-scale switching, multilevel capability, and high On/Off ratio. Here, resistive switching property of HC(NH2)(2)PbI3 (FAPbI(3)) depending on structural phase is reported. It is found that 1D hexagonal FAPbI(3) (delta-FAPbI(3)), formed at relatively low temperature, is active in memristor, while 3D trigonal FAPbI3 (alpha-FAPbI(3)), formed at temperature higher than 150 degrees C, is inactive. Failure of switching from low resistance state to high resistance state is found for alpha-FAPbI(3), while delta-FAPbI(3) shows stable switching behavior. Density functional calculation reveals that iodine cluster in isotropic 3D alpha-FAPbI(3) is so stable after forming filament that the filament is hard to be ruptured at off state. However, for anisotropic delta-FAPbI(3), iodine cluster is not stable and migration barrier is much lower for c-axis (0.48 eV) than for ab-plane (0.9 eV), which is beneficial for switching. The memristor devices based on delta-FAPbI(3) demonstrate endurance up to 1200 cycles with On/Off ratio (>10(5)), retention time up to 3000 s, multilevel storage capacity, and working even at 80 degrees C.-
dc.languageEnglish-
dc.publisherWILEY-
dc.relation.isPartOfADVANCED ELECTRONIC MATERIALS-
dc.title1D Hexagonal HC(NH2)(2)PbI3 for Multilevel Resistive Switching Nonvolatile Memory-
dc.typeArticle-
dc.identifier.doi10.1002/aelm.201800190-
dc.type.rimsART-
dc.identifier.bibliographicCitationADVANCED ELECTRONIC MATERIALS, v.4, no.9-
dc.identifier.wosid000444071300010-
dc.citation.number9-
dc.citation.titleADVANCED ELECTRONIC MATERIALS-
dc.citation.volume4-
dc.contributor.affiliatedAuthorLEE, DONGHWA-
dc.identifier.scopusid2-s2.0-85050894055-
dc.description.journalClass1-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.type.docTypeArticle-
dc.subject.keywordAuthordelta phase-
dc.subject.keywordAuthorformamidinium lead iodide-
dc.subject.keywordAuthorHC(NH2)(2)PbI3-
dc.subject.keywordAuthormultilevel-
dc.subject.keywordAuthorresistive switching memory-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-

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이동화LEE, DONGHWA
Dept of Materials Science & Enginrg
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