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Defects in electronic materials studied by synchrotron imaging
- Title
- Defects in electronic materials studied by synchrotron imaging
- Authors
- 제정호
- Article Type
- Conference
- Citation
- 2nd Korean-Swiss Workshop on Novel Coherence-based Radiology Techniques
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Related Researcher
- 제정호JE, JUNG HO
- Dept of Materials Science & Enginrg