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Atomic layer chemical vapor deposition (ALCVD) of hafnium silicate films for nano CMOS gate dielectric applications

Title
Atomic layer chemical vapor deposition (ALCVD) of hafnium silicate films for nano CMOS gate dielectric applications
Authors
이시우
URI
https://oasis.postech.ac.kr/handle/2014.oak/91280
Article Type
Conference
Citation
Korea-Japan Symposium on Materials (O-1)
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