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dc.contributor.author이시우-
dc.date.accessioned2018-06-24T13:13:26Z-
dc.date.available2018-06-24T13:13:26Z-
dc.date.created2009-03-27-
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/91280-
dc.relation.isPartOfKorea-Japan Symposium on Materials (O-1)-
dc.relation.isPartOfKorea-Japan Symposium on Materials (O-1)-
dc.titleAtomic layer chemical vapor deposition (ALCVD) of hafnium silicate films for nano CMOS gate dielectric applications-
dc.typeConference-
dc.type.rimsCONF-
dc.identifier.bibliographicCitationKorea-Japan Symposium on Materials (O-1)-
dc.citation.conferenceDate2003-05-22-
dc.citation.titleKorea-Japan Symposium on Materials (O-1)-
dc.contributor.affiliatedAuthor이시우-
dc.description.journalClass1-
dc.description.journalClass1-

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