Full metadata record
DC Field | Value | Language |
dc.contributor.author | 이시우 | - |
dc.date.accessioned | 2018-06-23T14:01:47Z | - |
dc.date.available | 2018-06-23T14:01:47Z | - |
dc.date.created | 2009-03-27 | - |
dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/90560 | - |
dc.publisher | Materials Division Korean Institute of Chemical Engineers | - |
dc.relation.isPartOf | The 3rd symposium on nano chemical processing | - |
dc.relation.isPartOf | The 3rd symposium on nano chemical processing | - |
dc.title | In-situ FT-IR Diagnostics of Atomic Layer Deposition Process | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.identifier.bibliographicCitation | The 3rd symposium on nano chemical processing | - |
dc.citation.conferenceDate | 2005-08-26 | - |
dc.citation.title | The 3rd symposium on nano chemical processing | - |
dc.contributor.affiliatedAuthor | 이시우 | - |
dc.description.journalClass | 2 | - |
dc.description.journalClass | 2 | - |
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