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In-situ diagnosis using FT-IR and the characterization of Hf nitride films

Title
In-situ diagnosis using FT-IR and the characterization of Hf nitride films
Authors
이시우
Publisher
한국진공학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/90553
Article Type
Conference
Citation
제31회 한국진공학회 학술논문발표회
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