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dc.contributor.author맹완주en_US
dc.date.accessioned2015-02-25T14:00:44Z-
dc.date.available2015-02-25T14:00:44Z-
dc.date.issued2009en_US
dc.identifier.otherOAK-2015-06628en_US
dc.identifier.urihttp://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001909766en_US
dc.identifier.urihttps://oasis.postech.ac.kr/handle/2014.oak/9009-
dc.descriptionDoctoren_US
dc.languagekoren_US
dc.publisher포항공과대학교en_US
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleHfO2 기반 고유전율 게이트 산화물 박막의 원자층 증착법과 계면 특성 향상에 대한 연구en_US
dc.title.alternativeStudy on atomic layer deposition of HfO2 based high-k gate dielectric and interface properties enhancementen_US
dc.typeThesisen_US
dc.contributor.college일반대학원 신소재공학과en_US
dc.date.degree2009-08en_US
dc.type.docTypeThesis-

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