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An Automatic Method for Extracting and Classifying Defect in Optical Photomask Images
- Title
- An Automatic Method for Extracting and Classifying Defect in Optical Photomask Images
- Authors
- 정홍
- Publisher
- IEEE Computer Society
- Article Type
- Conference
- Citation
- International Conference on Multimedai and Ubiquitous Engineering, page. 710 - 716
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Related Researcher
- 정홍JEONG, HONG
- Dept of Electrical Enginrg