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Photomask Defect Extraction by Using Difference between a Reference Image and a Test Image after Illumination Adjustment
- Title
- Photomask Defect Extraction by Using Difference between a Reference Image and a Test Image after Illumination Adjustment
- Authors
- 정홍
- Article Type
- Conference
- Citation
- 2007 International Conference on Intelligent Pervasive Computing IPC-07, page. 242 - 248
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- 정홍JEONG, HONG
- Dept of Electrical Enginrg