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Atomic Force Microscopy Studies on Nanscale Films of Low Dielectric Composites Containing Nanopores

Title
Atomic Force Microscopy Studies on Nanscale Films of Low Dielectric Composites Containing Nanopores
Authors
이문호
URI
https://oasis.postech.ac.kr/handle/2014.oak/85812
Article Type
Conference
Citation
3rd International Conference on Scanning Probe Microscopy of Polymers, page. 20 - 20
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이문호REE, MOONHOR
Dept of Chemistry
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