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Statistical Estimation of Leakage Current for VLSI Circuits under Process Variation

Title
Statistical Estimation of Leakage Current for VLSI Circuits under Process Variation
Authors
도경태
Date Issued
2007
Publisher
포항공과대학교
URI
http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001908057
http://oasis.postech.ac.kr/handle/2014.oak/8274
Article Type
Thesis
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