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Synchrotron x-ray reflectivity as a probe for nm-scale thin films
- Title
- Synchrotron x-ray reflectivity as a probe for nm-scale thin films
- Authors
- 이기봉
- Date Issued
- 1999-12-07
- Article Type
- Conference
- Citation
- Discussion Meeting on Materials Research using Accelerator Facilities, 1999-12-07
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Related Researcher
- 이기봉LEE, KI BONG
- Div. of Advanced Nuclear Enginrg