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Combining Synchrotron X-ray Diffraction Imaging and Microscopy for Defect Characterization in Materials
- Title
- Combining Synchrotron X-ray Diffraction Imaging and Microscopy for Defect Characterization in Materials
- Authors
- 이재목
- Date Issued
- 2006
- Publisher
- 포항공과대학교
- URI
- http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001907538
https://oasis.postech.ac.kr/handle/2014.oak/7756
- Article Type
- Thesis
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