Nano-scale Characterization of Interfacial Reactions in SrRuO3 Thin Film on Si substrate
- Title
- Nano-scale Characterization of Interfacial Reactions in SrRuO3 Thin Film on Si substrate
- Authors
- 박찬경
- Date Issued
- 2000-05-01
- Publisher
- 한국전자현미경학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/76436
- Article Type
- Conference
- Citation
- 제 31차 한국전자현미경학회 춘계학술대회, 2000-05-01
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