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Nano-scale Characterization of Interfacial Reactions in SrRuO3 Thin Film on Si substrate

Title
Nano-scale Characterization of Interfacial Reactions in SrRuO3 Thin Film on Si substrate
Authors
박찬경
Date Issued
2000-05-01
Publisher
한국전자현미경학회
URI
https://oasis.postech.ac.kr/handle/2014.oak/76436
Article Type
Conference
Citation
제 31차 한국전자현미경학회 춘계학술대회, 2000-05-01
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박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
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