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dc.contributor.author임근배ko
dc.contributor.authorDong-Sun Kimko
dc.contributor.authorYong-Taek Jeongko
dc.contributor.authorJang-Kyoo Shinko
dc.contributor.authorPyung Choiko
dc.contributor.authorJong-Hyun Leeko
dc.date.accessioned2018-06-18T07:29:43Z-
dc.date.available2018-06-18T07:29:43Z-
dc.date.created2013-03-26-
dc.date.issued2003-01-13-
dc.identifier.citationThe 1st International Meeting on Microsensors and Microsystems-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/63681-
dc.publisherMicrosensors and Microsystems-
dc.titleAn FET-type charge sensor for highly sensitive detection of DNA sequence-
dc.typeConference-
dc.type.rimsCONF-
dc.contributor.localauthor임근배-
dc.contributor.nonIdAuthorDong-Sun Kim-
dc.contributor.nonIdAuthorYong-Taek Jeong-
dc.contributor.nonIdAuthorJang-Kyoo Shin-
dc.contributor.nonIdAuthorPyung Choi-
dc.contributor.nonIdAuthorJong-Hyun Lee-
dc.citation.titleThe 1st International Meeting on Microsensors and Microsystems-
dc.description.journalClass1-
dc.identifier.conferencecountryCH-

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임근배LIM, GEUN BAE
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