Conference
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Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 박찬경 | - |
| dc.contributor.author | 정우영 | - |
| dc.contributor.author | 구길호 | - |
| dc.date.accessioned | 2018-06-18T07:19:51Z | - |
| dc.date.available | 2018-06-18T07:19:51Z | - |
| dc.date.created | 2013-03-15 | - |
| dc.date.issued | 2012-03-11 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/63495 | - |
| dc.publisher | TMS | - |
| dc.relation.isPartOf | TMS 2012 | - |
| dc.title | Possibility of Electron Beam Damage on the InGaN Well Layers of LED Evaluated by Atom Probe Tomography | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | TMS 2012 | - |
| dc.citation.title | TMS 2012 | - |
| dc.contributor.affiliatedAuthor | 박찬경 | - |
| dc.contributor.affiliatedAuthor | 정우영 | - |
| dc.contributor.affiliatedAuthor | 구길호 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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Related Researcher
- 박찬경PARK, CHAN GYUNG
- Dept of Materials Science & Enginrg