Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Possibility of Electron Beam Damage on the InGaN Well Layers of LED Evaluated by Atom Probe Tomography

Title
Possibility of Electron Beam Damage on the InGaN Well Layers of LED Evaluated by Atom Probe Tomography
Authors
박찬경정우영구길호
POSTECH Authors
박찬경
Date Issued
11-Mar-2012
Publisher
TMS
URI
http://oasis.postech.ac.kr/handle/2014.oak/63495
Article Type
Conference
Citation
TMS 2012, 2012-03-11
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

박찬경PARK, CHAN GYUNG
Dept of Materials Science & Enginrg
Read more

Views & Downloads

Browse