Effect of electron–electron scattering at an elevated temperature on device
- Title
- Effect of electron–electron scattering at an elevated temperature on device
- Authors
- 강봉구; 이선행
- Date Issued
- 2012-10-01
- Publisher
- Microelectronics Reliability
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/62645
- Article Type
- Conference
- Citation
- European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2012-10-01
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.