Probabilistic models for common spatial patterns: Parameter-expanded EM and variational Bayes
- Probabilistic models for common spatial patterns: Parameter-expanded EM and variational Bayes
- 최승진; 강효형
- POSTECH Authors
- Date Issued
- Association for the Advancement of Artificial Intelligence
- Article Type
- AAAI Conference on Artificial Intelligence (AAAI-2012), 2012-07-26
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