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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | ko |
| dc.date.accessioned | 2018-06-18T04:58:16Z | - |
| dc.date.available | 2018-06-18T04:58:16Z | - |
| dc.date.created | 2012-04-27 | - |
| dc.date.issued | 2009-09-16 | - |
| dc.identifier.citation | 2009 IEEE European Solid-State Device Research Conference | - |
| dc.identifier.uri | http://oasis.postech.ac.kr/handle/2014.oak/61518 | - |
| dc.publisher | IEEE | - |
| dc.title | RF Performance Degradation in 100-nm Metal Gate/High-k Dielectric nMOSFET by Hot Carrier Effects | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.contributor.localauthor | 정윤하 | - |
| dc.citation.title | 2009 IEEE European Solid-State Device Research Conference | - |
| dc.description.journalClass | 1 | - |
| dc.identifier.conferencecountry | GR | - |
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- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg