Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정윤하 | - |
| dc.date.accessioned | 2018-06-18T04:58:07Z | - |
| dc.date.available | 2018-06-18T04:58:07Z | - |
| dc.date.created | 2012-04-27 | - |
| dc.date.issued | 2010-10-13 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/61515 | - |
| dc.publisher | IEEE | - |
| dc.relation.isPartOf | Nanotechnology Materials and Devices Conference | - |
| dc.relation.isPartOf | 2010 IEEE NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE | - |
| dc.title | Reliability Properties in sub-50nm High Performance High-k/Metal Gate Stacks SiGe pMOSFETs | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | Nanotechnology Materials and Devices Conference | - |
| dc.citation.conferencePlace | US | - |
| dc.citation.title | Nanotechnology Materials and Devices Conference | - |
| dc.contributor.affiliatedAuthor | 정윤하 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 정윤하JEONG, YOON HA
- Dept of Electrical Enginrg