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dc.contributor.author정윤하ko
dc.date.accessioned2018-06-18T04:58:00Z-
dc.date.available2018-06-18T04:58:00Z-
dc.date.created2012-04-27-
dc.date.issued2011-02-18-
dc.identifier.citation18th Korean Conference on Semiconductors-
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/61513-
dc.publisherKorean Conference on Semiconductors-
dc.titleHot Carrier Effect on RF Characteristics of 100-nm High-k/Metal Gate SiGe Channel pMOSFETs-
dc.typeConference-
dc.type.rimsCONF-
dc.contributor.localauthor정윤하-
dc.citation.title18th Korean Conference on Semiconductors-
dc.description.journalClass2-
dc.identifier.conferencecountryKO-

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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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