Hot Carrier Effect on RF Characteristics of 100-nm High-k/Metal Gate SiGe Channel pMOSFETs
- Hot Carrier Effect on RF Characteristics of 100-nm High-k/Metal Gate SiGe Channel pMOSFETs
- POSTECH Authors
- Date Issued
- Korean Conference on Semiconductors
- Article Type
- 18th Korean Conference on Semiconductors, 2011-02-18
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