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Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress

Title
Investigation of GIDL Behavior in Si-Nanowire FET with Hot Carrier Stress
Authors
정윤하
POSTECH Authors
정윤하
Date Issued
18-Feb-2011
Publisher
Korean Conference on Semiconductors
URI
http://oasis.postech.ac.kr/handle/2014.oak/61512
Article Type
Conference
Citation
18th Korean Conference on Semiconductors, 2011-02-18
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정윤하JEONG, YOON HA
Dept of Electrical Enginrg
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