Thermal degradation mechanism of Ti/Al n-contact to N-face n-GaN
- Thermal degradation mechanism of Ti/Al n-contact to N-face n-GaN
- 이종람; 김범준; 송양희; 유학기; 손준호
- POSTECH Authors
- Date Issued
- ACP 2011
- Article Type
- Asia Communications & Photonics Conference & Exhibition, 2011-11-13
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