Conference
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정홍 | - |
| dc.contributor.author | 이원석 | - |
| dc.contributor.author | 한상현 | - |
| dc.date.accessioned | 2018-06-18T00:32:24Z | - |
| dc.date.available | 2018-06-18T00:32:24Z | - |
| dc.date.created | 2011-03-30 | - |
| dc.date.issued | 2010-08-25 | - |
| dc.identifier.uri | https://oasis.postech.ac.kr/handle/2014.oak/57591 | - |
| dc.publisher | POSTECH-KYUTECH | - |
| dc.relation.isPartOf | The 10th POSTECH-KYUTECH Joint Workshop On Neuroinformatics | - |
| dc.relation.isPartOf | THE 10TH POSTECH-KYUTECH JOINT WORKSHOP ON NEUROINFORMATICS | - |
| dc.title | Measurement of Critical Dimension in SEM Mask | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.identifier.bibliographicCitation | The 10th POSTECH-KYUTECH Joint Workshop On Neuroinformatics, pp.49 - 50 | - |
| dc.citation.conferencePlace | JA | - |
| dc.citation.endPage | 50 | - |
| dc.citation.startPage | 49 | - |
| dc.citation.title | The 10th POSTECH-KYUTECH Joint Workshop On Neuroinformatics | - |
| dc.contributor.affiliatedAuthor | 정홍 | - |
| dc.contributor.affiliatedAuthor | 이원석 | - |
| dc.contributor.affiliatedAuthor | 한상현 | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalClass | 1 | - |
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- 정홍JEONG, HONG
- Dept of Electrical Enginrg