Measurement of the Size Effect in the Micron-Size Structures Using the AFM
- Measurement of the Size Effect in the Micron-Size Structures Using the AFM
- POSTECH Authors
- Date Issued
- Article Type
- ASME International Mechanical Engineering Congress & Exposition, 2005-11-07
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.