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An Automated Method based on Second Order Moment for Defect Extraction in Photomask Images

Title
An Automated Method based on Second Order Moment for Defect Extraction in Photomask Images
Authors
정홍최지희YanSheng
Date Issued
2009-02-16
Publisher
ETRI,NIA, GIRI
URI
https://oasis.postech.ac.kr/handle/2014.oak/53588
Article Type
Conference
Citation
The 11th International Conference on Advanced Communication Technology, page. 1015 - 1018, 2009-02-16
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정홍JEONG, HONG
Dept of Electrical Enginrg
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