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Stacked Gate Flash EEPROM에서 Bit Line Vpltage Stress가 Floating Gate의 Charge Loss에 미치는 영향 연구
- Title
- Stacked Gate Flash EEPROM에서 Bit Line Vpltage Stress가 Floating Gate의 Charge Loss에 미치는 영향 연구
- Authors
- 안병희
- Date Issued
- 2000
- Publisher
- 포항공과대학교
- URI
- http://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001905124
https://oasis.postech.ac.kr/handle/2014.oak/5353
- Article Type
- Thesis
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