In-situ Heating EBSD Study of Effects of Cold Reduction Ratio on Recrystallization and Grain Growth Behaviors in 3% Si Electrical Steels

Abstract

Crystallographic texture development during recrystallization in samples cold-rolled to 78, 87 and 96% thickness reduction R were measured using EBSD on an in-situ heating stage inside a field emission scanning electron microscope. Nucleation, recrystallization and grain growth of grains having {411} < 148 > orientation occurred intensely and steadily inside the deformed region. Through this phenomenon, grains having {411} < 148 > showed larger average grain sizes than other textures at R = 87% and 96%. Due to the {411} < 148 > texture component, the {111} < 112 > texture component, which is known as a high reduction emerging texture, weakened. At R = 76%, grains having Goss orientation were frequently observed. However, at R = 87% and 96%, the {111} < 112 > and the {411} < 148 > texture components became dominant and the alpha* fiber was strengthened.