Conference
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Title
- Novel Extrinsic Series Resistance Extraction Methodology for Nanoscale MOSFETs
- Date Issued
- 2008-12-02
- Publisher
- IEEE
- Article Type
- Conference
- Citation
- RFM 2008, 2008-12-02
- Files in This Item:
- There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.
Communities & Collection
Related Researcher
- 백록현BAEK, ROCK HYUN
- Dept of Electrical Enginrg