Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model
- Title
- Accurate Extraction of Volume Trap Density from Si-Nanowire FET using the Newly Developed Cylindrical Coordinate Based 1/f noise model
- Authors
- 백록현; 백창기; 최현식; 이정수; 여윤영; 여경환; 김동원; 김기남; 김대만; 정윤하
- Date Issued
- 2010-02-24
- Publisher
- 대한전자공학회
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/49825
- Article Type
- Conference
- Citation
- 17th Korean Conference on Semiconductors (2010), 2010-02-24
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- There are no files associated with this item.
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