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Bias-Stress-Induced Charge Trapping in Organic Transistor
- Title
- Bias-Stress-Induced Charge Trapping in Organic Transistor
- Date Issued
- 2016-11-28
- Publisher
- Material Research Society
- Article Type
- Conference
- Citation
- 2016 MRS Fall Meeting, 2016-11-28
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Related Researcher
- 조길원CHO, KIL WON
- Dept. of Chemical Enginrg