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Quantitative analysis of lamellar structures in poly[oxy(n-decylthiomethylenyl)ethylene] thin films by synchrotron grazing-incidence X-ray scattering

Title
Quantitative analysis of lamellar structures in poly[oxy(n-decylthiomethylenyl)ethylene] thin films by synchrotron grazing-incidence X-ray scattering
Authors
이문호김진철윤진환진경식김현철김가희허규용이택준진상우박삼대김동민정정운노예철안병철권원상김경태김미희고용기정성민최준만
POSTECH Authors
이문호
Date Issued
2009-11-30
Publisher
Shanghai Synchrotron Radiation Facility, Shanghai,
URI
https://oasis.postech.ac.kr/handle/2014.oak/46380
Article Type
Conference
Citation
4th Asia-Oceania Forum for Synchrotron Radiation Research, 2009-11-30
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이문호REE, MOONHOR
Dept of Chemistry
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