Open Access System for Information Sharing

Login Library

 

Conference
Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)

Title
A Defect Inspection Method for TFT panel using the Compute Unified Device Architecture (CUDA)
Authors
박부견정창기유진유
POSTECH Authors
박부견
Date Issued
7-Jul-2009
Publisher
IEEE KOREA
URI
http://oasis.postech.ac.kr/handle/2014.oak/45953
Article Type
Conference
Citation
IEEE International Symposium on Industrial Electronics (ISlE 2009), 2009-07-07
Files in This Item:
There are no files associated with this item.

qr_code

  • mendeley

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher

박부견PARK, POOGYEON
Dept of Electrical Enginrg
Read more

Views & Downloads

Browse