Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis
- Title
- Effect of Local Random Variation on Gate-Level Delay and Leakage Statistical Analysis
- Authors
- 김영환; 김재훈; 김욱
- Date Issued
- 2009-07-16
- Publisher
- Asia Symposium on Quality Electronic Design(Asqed)
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/45949
- Article Type
- Conference
- Citation
- Asia Symposium on Quality Electronic Design(Asqed) 2009, 2009-07-16
- Files in This Item:
- There are no files associated with this item.
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