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Issue Date	Title
2008-Jan	Full-field hard x-ray microscopy below 30 nm: a challenging nanofabrication achievement link NANOTECHNOLOGY, vol. 19, no. 39, 2008-01 Chen, YT; Lo, TN; Chu, YS; Yi, J; Liu, CJ; Wang, JY; Wang, CL; Chiu, CW; Hua, TE; Hwu, Y; Shen, Q; Yin, GC; Liang, KS; Lin, HM; Je, JH; Margaritondo, G

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