In-situ X-ray diffraction study about uniaxial deformation behavior in a copper single crystal
SCIE
SCOPUS
- Title
- In-situ X-ray diffraction study about uniaxial deformation behavior in a copper single crystal
- Authors
- Kim, KH; Koo, YM
- Date Issued
- 2002-09-25
- Publisher
- ELSEVIER SCIENCE SA
- Abstract
- The deformation behavior of pure Cu single crystal has been investigated by scanning electron microscopy (SEM) and the in-situ reflection Lane method using synchrotron radiation. The main operative slip systems were determined by the slip line measurement and in-situ X-ray diffraction. The ( (1) over bar 11)[101] and ((1) over bar 11)[0 (1) over bar1] slip systems mainly operate in the middle region of sample but the (111)[(1) over bar 01] and ((1) over bar(1) over bar1)[011] slip systems are activated in the corner region. The condition of a minimum glide path-length through single crystal should be taken into account as one of the factors to determine the main operative slip system. (C) 2002 Elsevier Science B.V. All rights reserved.
- Keywords
- copper; reflection Laue method; single crystal; slip system; Schmid factor
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/29797
- DOI
- 10.1016/S0921-5093(01)01943-8
- ISSN
- 0921-5093
- Article Type
- Article
- Citation
- MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, vol. 335, no. 1-2, page. 309 - 312, 2002-09-25
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