Longitudinal and transverse magnetization components in thin films: A resonant magnetic reflectivity investigation using circularly polarized soft x-rays

Abstract

An in-plane vectorial analysis of the magnetization of thin magnetic films is presented. Longitudinal soft x-ray resonant magnetic reflectivity curves display characteristic nodes where the longitudinal scattering component is suppressed by x-ray interference. The transverse magnetic component can be effectively retrieved at these nodal points, despite the use of circular polarization and longitudinal scattering geometry. Using a single geometric configuration, transverse and longitudinal magnetic hysteresis loops can be clearly separated. Calculations based on a Stoner-Wohlfarth model satisfactorily describe both loops. Therefore, this method presents a viable alternative to standard vectorial analysis techniques, with the additional benefit of element specificity.