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Thesis
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dc.contributor.author신동원en_US
dc.date.accessioned2015-02-24T12:37:40Z-
dc.date.available2015-02-24T12:37:40Z-
dc.date.issued1991en_US
dc.identifier.otherOAK-2015-00193en_US
dc.identifier.urihttp://postech.dcollection.net/jsp/common/DcLoOrgPer.jsp?sItemId=000001897343en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/2573-
dc.descriptionMasteren_US
dc.languagekoren_US
dc.publisher포항공과대학교en_US
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.title투과전자현미경을 이용한 Si 반도체 재료의 표면부 미세 구조 연구en_US
dc.typeThesisen_US
dc.contributor.college일반대학원 재료금속공학과en_US
dc.date.degree1991-02en_US

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