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Piezoelectric effect in epitaxial PbZr1-xTixO3 thin films near morphotropic phase boundary region SCIE SCOPUS

Title
Piezoelectric effect in epitaxial PbZr1-xTixO3 thin films near morphotropic phase boundary region
Authors
Kim, YKKim, SSLee, BShin, HBaik, S
Date Issued
2005-04
Publisher
MATERIALS RESEARCH SOCIETY
Abstract
The relationship between crystal structure and piezo-response was investigated in epitaxially grown PbZr1-xTixO3 (PZT) thin films on Pt(001)/MgO(001) with a thin PbTiO3 interlayer. Insertion of the interlayer resulted in significant relaxation of the strain that could be developed in the course of deposition of the PZT films, consequently leading us to single out only the effect of composition. Composition of the morphotropic phase boundary (MPB), at which tetragonal and rhombohedral phases are mixed with the same volume fraction, was found to be similar to 0.55 in Ti/(Zr + Ti) ratio in our films, which is close to the value for bulk polycrystalline PZT (similar to 0.50). The piezoelectric response peaks were two times higher in the MPB regime than in the single phase regime due to structural instability caused by the coexistence of two phases. The results indicate that epitaxial PZT films having the MPB composition are advantageous over those of other compositions for nano-storage devices based on scanning force microscopy.
Keywords
DOMAIN; PT(001)/MGO(001); ORIENTATION; FATIGUE
URI
https://oasis.postech.ac.kr/handle/2014.oak/24588
DOI
10.1557/JMR.2005.012
ISSN
0884-2914
Article Type
Article
Citation
JOURNAL OF MATERIALS RESEARCH, vol. 20, no. 4, page. 787 - 790, 2005-04
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