Domain structure of epitaxial PZT thin films grown on MgO(001) by RF magnetron sputtering
SCIE
SCOPUS
- Title
- Domain structure of epitaxial PZT thin films grown on MgO(001) by RF magnetron sputtering
- Authors
- Lee, KS; Kang, YM; Baik, S
- Date Issued
- 1997-01
- Publisher
- GORDON BREACH SCI PUBL LTD
- Abstract
- Epitaxial Pb(ZrxTi1-x)O-3 (x=0.0 similar to 0.32) thin-films were successfully grown on MgO(001) single crystal by RF magnetron sputtering. Lattice constants and crystal quality of the films were measured by the X-ray theta-2 theta scan and the FWHM of (001) rocking curves, respectively. Degree of c axis orientation and crystal quality of the films improved gradually with increasing Zr concentration. High temperature X-ray technique was employed to study the domain formation as a function of temperature during cooling from cubic phase to tetragonal phase. The initial values of a at the Curie temperature also increased with increasing Zr concentration.
- Keywords
- STRAIN RELAXATION; DEPOSITION; MGO(100)
- URI
- https://oasis.postech.ac.kr/handle/2014.oak/21352
- DOI
- 10.1080/10584589708019975
- ISSN
- 1058-4587
- Article Type
- Article
- Citation
- INTEGRATED FERROELECTRICS, vol. 14, no. 1-4, page. 43 - 49, 1997-01
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- There are no files associated with this item.
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