Study of Organic Thin-Film Transistors Under Electrostatic Discharge Stresses

Abstract

Low-voltage pentacene-based organic thin-film transistors (OTFTs) are characterized for the first time under the electrostatic discharge (ESD) stresses. The measurements are conducted using the transmission line pulsing (TLP) tester which generates the human body model equivalent pulses. The ESD behaviors and tolerances of OTFTs having different dimensions and gate biasing conditions are investigated. OTFT's failure mechanism and dc performance degradation due to the ESD stresses are also studied.