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Cited 11 time in webofscience Cited 12 time in scopus
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dc.contributor.authorJung, JWko
dc.contributor.authorLee, JSko
dc.contributor.authorKwon, Nko
dc.contributor.authorPark, SJko
dc.contributor.authorChang, Sko
dc.contributor.authorKim, Jko
dc.contributor.authorPyo, Jko
dc.contributor.authorKohmura, Yko
dc.contributor.authorNishino, Yko
dc.contributor.authorYamamoto, Mko
dc.contributor.authorIshikawa, Tko
dc.contributor.authorJe, JHko
dc.date.available2015-06-25T03:31:03Z-
dc.date.created2012-11-22-
dc.date.issued2012-09-
dc.identifier.citationREVIEW OF SCIENTIFIC INSTRUMENTS, v.83, no.9-
dc.identifier.issn0034-6748-
dc.identifier.other2015-OAK-0000025998en_US
dc.identifier.urihttp://oasis.postech.ac.kr/handle/2014.oak/12829-
dc.description.statementofresponsibilityopenen_US
dc.format.extentpdfen_US
dc.languageEnglish-
dc.publisherAMERICAN INSTITUTE OF PHYSICS-
dc.rightsBY_NC_NDen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/2.0/kren_US
dc.titleFast microtomography using bright monochromatic x-rays-
dc.typeArticle-
dc.contributor.college신소재공학과en_US
dc.identifier.doi10.1063/1.4751853-
dc.author.googleJung, JWen_US
dc.author.googleLee, JSen_US
dc.author.googleJe, JHen_US
dc.author.googleIshikawa, Ten_US
dc.author.googleYamamoto, Men_US
dc.author.googleNishino, Yen_US
dc.author.googleKohmura, Yen_US
dc.author.googlePyo, Jen_US
dc.author.googleKim, Jen_US
dc.author.googleChang, Sen_US
dc.author.googlePark, SJen_US
dc.author.googleKwon, Nen_US
dc.relation.volume83en_US
dc.relation.issue9en_US
dc.contributor.id10123980en_US
dc.publisher.locationUSen_US
dc.relation.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.relation.indexSCI급, SCOPUS 등재논문en_US
dc.relation.sciSCIen_US
dc.collections.nameJournal Papersen_US
dc.type.rimsART-
dc.contributor.localauthorJe, JH-
dc.contributor.nonIdAuthorJung, JW-
dc.contributor.nonIdAuthorLee, JS-
dc.contributor.nonIdAuthorKwon, N-
dc.contributor.nonIdAuthorPark, SJ-
dc.contributor.nonIdAuthorChang, S-
dc.contributor.nonIdAuthorKim, J-
dc.contributor.nonIdAuthorPyo, J-
dc.contributor.nonIdAuthorKohmura, Y-
dc.contributor.nonIdAuthorNishino, Y-
dc.contributor.nonIdAuthorYamamoto, M-
dc.contributor.nonIdAuthorIshikawa, T-
dc.identifier.wosid000309426700027-
dc.date.tcdate2019-01-01-
dc.citation.number9-
dc.citation.titleREVIEW OF SCIENTIFIC INSTRUMENTS-
dc.citation.volume83-
dc.identifier.scopusid2-s2.0-84867008593-
dc.description.journalClass1-
dc.description.wostc7-
dc.description.scptc10*
dc.date.scptcdate2018-10-274*

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제정호JE, JUNG HO
Dept of Materials Science & Enginrg
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