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Fast Ion Induced Shearing of 2D Alfven Eigenmodes Measured by Electron Cyclotron Emission Imaging SCIE SCOPUS

Title
Fast Ion Induced Shearing of 2D Alfven Eigenmodes Measured by Electron Cyclotron Emission Imaging
Authors
Tobias, BJClassen, IGJDomier, CWHeidbrink, WWLuhmann, NCNazikian, RPark, HKSpong, DAVan Zeel, MA
Date Issued
2011-02-16
Publisher
APS
Abstract
Two-dimensional images of electron temperature perturbations are obtained with electron cyclotron emission imaging (ECEI) on the DIII-D tokamak and compared to Alfven eigenmode structures obtained by numerical modeling using both ideal MHD and hybrid MHD-gyrofluid codes. While many features of the observations are found to be in excellent agreement with simulations using an ideal MHD code (NOVA), other characteristics distinctly reveal the influence of fast ions on the mode structures. These features are found to be well described by the nonperturbative hybrid MHD-gyrofluid model TAEFL.
URI
https://oasis.postech.ac.kr/handle/2014.oak/12485
DOI
10.1103/PhysRevLett.106.075003
ISSN
0031-9007
Article Type
Article
Citation
PHYSICAL REVIEW LETTERS, vol. 106, no. 7, page. 75003 - 75003, 2011-02-16
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